6/23/2023 0 Comments Anritsu vectorstar![]() Mounting and demounting of on-wafer devices, which can cause major errors in measurement, are eliminated with the solution. The VNA-spectrum analyser solution is ideal for on-wafer measurements, as it leverages VectorStar’s inherent advantages of making a direct connection to an on-wafer device. It allows engineers to analyze VNA-like and spectrum-analyser-like response of a device under test (DUT). Spectral domain measurements of harmonics, spurious, other distortion products, and general frequency content can be made effectively with the single-instrument solution. Simultaneous, sequential S-parameter and spectrum analysis are possible with the VNA-spectrum analyser instrument. It is particularly beneficial for applications involving mixers and amplifiers, including those with multiple outputs or input-output comparisons. Integrating VNA/spectrum analyser capability provides engineers with an innovative method to quickly transfer a challenging VNA measurement to the spectrum analyser – without changing the test setup or using multiple instruments. The spectrum analyzer option is compatible with all baseband VectorStar models – broadband and banded system configurations.
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